IEEE Design & Test

IEEE Design & Test, or simply Design & Test, is a magazine is cosponsored by the Council on EDA, Circuits and Systems Society, and the IEEE Solid State Circuits Society of the IEEE offering original works describing the models, methods and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy efficient design, electronic design automation tools, practical technology, and standards. Technical articles are peer reviewed.

IEEE Design & Test
EditorJoerg Henkel
FrequencyBi-monthly
PublisherIEEE
Year founded1984
CountryUSA
Based inNew York City
Websitehttp://ieee-ceda.org/publications/d-t
ISSN2168-2356
OCLC57216796

IEEE Design & Test is a bimonthly publication. It was published as IEEE Design & Test of Computers between 1984 and 2012.

The current editor is Joerg Henkel of Karlsruhe Institute of Technology.

See also


This article is issued from Wikipedia. The text is licensed under Creative Commons - Attribution - Sharealike. Additional terms may apply for the media files.